Le parti elettroniche : SN54BCT8374AFK

Produttore : Texas Instruments

Imballaggio :

Pins :

Descrizione : SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

Temperatura : Min °C | Max °C

Datasheet : SN54BCT8374AFK PDF

• SN54BCT8373A
• SN54BCT8373AFK
• SN54BCT8373AJT
• SN54BCT8374A
• SN54BCT8374AFK
• SN54BCT8374AJT
• SN54BCT8374A_08